Plot, Analyze, and Format Scientific Data Online
InstaNANO Graph Plotter is a free browser-based scientific graphing and data-analysis tool for researchers, students, laboratories, and R&D teams. Import experimental data, choose a scientific graph type, apply analysis tools, customize the figure, and prepare journal-friendly graphs without installing desktop software.
The same workspace supports routine plotting, advanced curve analysis, online XRD phase identification, full-pattern Rietveld or RIR analysis, and FTIR spectrum matching. Graph plotting and general processing are free, with free previews for XRD and FTIR matching. Complete XRD matching and refinement, along with full FTIR matching, functional-group estimation, and composition analysis, use analysis credits.
Scientific Graph Types for Research Data
Select the graph from the structure of the experimental data and the comparison that must remain visible. The InstaNANO catalog includes ordered profiles, categorical comparisons, uncertainty displays, distribution summaries, X–Y–Z fields, 3D surfaces, directional measurements, and three-component composition diagrams.
The representative interactive examples below cover graph types commonly required in scientific work. The complete directory also includes stacked, multi-axis, error-band, probability, density, area, scatter-line, and related variants.
Supported Scientific Data Files and Input Methods
Data can be entered manually, pasted from a spreadsheet, or imported by drag and drop. Native support for compatible XRD, FTIR, and NMR data reduces the need to convert every instrument export before plotting.
| Input category | Supported inputs |
|---|---|
| Manual and spreadsheet input | Editable table entry, copied spreadsheet cells, added rows, and added columns |
| Text data | .csv and .txt files containing comma-, tab-, or whitespace-separated values |
| Excel workbooks | .xls and .xlsx files using the first worksheet |
| XRDML | Direct import of .xrdml diffraction files |
| XRD ASCII files | .xy, .xye, .asc, .dat, and .uxd |
| Supported XRD RAW files | Supported Rigaku Ultima IV and Bruker RAW4.00 files |
| Supported FTIR instrument files | Compatible .spa and .ispd spectra, alongside numerical text and spreadsheet exports |
| NMR data | Processed spectra through CSV or TXT, and supported Bruker datasets containing fid and acqus |
| Saved InstaNANO projects | .instanano projects containing graph data, settings, formatting, annotations, and supported matching state |
Instrument-Specific Graph Presets
Select an instrument preset to apply relevant example data, scientific axis titles, and expected axis orientation. Axis titles and scales remain editable when a different convention is required.
| Instrument or workflow | Default graph axes |
|---|---|
| UV–Vis spectroscopy | Wavelength (nm) and absorbance (a.u.) |
| FTIR spectroscopy | Wavenumber (cm−1) and transmittance (%), with reversed wavenumber orientation |
| X-ray diffraction (XRD) | 2θ (°) and intensity (a.u.) |
| Photoluminescence (PL) | Wavelength (nm) and intensity (a.u.) |
| Raman spectroscopy | Raman shift (cm−1) and intensity (a.u.) |
| X-ray photoelectron spectroscopy (XPS) | Binding energy (eV) and intensity (cps) |
| Thermogravimetric analysis (TGA) | Temperature (°C) and weight (%) |
| Differential scanning calorimetry (DSC) | Temperature (°C) and heat flow (mW) |
| BET adsorption analysis | Relative pressure (P/P0) and adsorbed volume (cm3 g−1) |
| Small-angle X-ray scattering (SAXS) | Scattering vector q (Å−1) and intensity (a.u.) |
| Nuclear magnetic resonance (NMR) | Chemical shift δ (ppm) and intensity (a.u.), with reversed chemical-shift orientation |
| Tauc plot | Energy (eV) and transformed intensity (a.u.) |
| Tensile testing | Strain and stress |
Advanced Scientific Data Analysis
The advanced-options panel provides numerical and spectral-processing tools within the graph workspace. Each operation produces plotted or tabulated output that can be reviewed before preparing the final figure.
| Analysis tool | Available capability |
|---|---|
| Data smoothing | Local-polynomial smoothing with an adjustable point window and live preview |
| Baseline correction | arPLS baseline estimation with adjustable stiffness, optional endpoint anchoring, baseline output, and corrected data output |
| Integrated area | Select a continuous graph range and calculate the integrated area relative to the applicable reference level |
| FWHM calculation | Select a graph range and calculate the full width at half maximum |
| Curve fitting | Linear and quadratic fitting with the fitted equation and coefficient of determination, R2 |
| Multi-peak fitting | Fit up to 12 selected peaks using Gaussian, Lorentzian, Voigt, asymmetric pseudo-Voigt, right-tailed EMG, or left-tailed EMG peak profiles |
| Peak-fit output | Fitted curve, individual components, residuals, peak center, FWHM, peak area, RMSE, R2, AICc, optional reduced χ2, and reliability warnings |
| Tauc transformation | Generate transformed Tauc data for direct, direct-forbidden, indirect, and indirect-forbidden electronic transitions |
Tauc note: The tool generates the selected Tauc transformation. The appropriate transition model and linear fitting region should be chosen from the physical properties and experimental behavior of the material.
Detailed Graph Customization
Graph elements can be edited directly so that line appearance, axes, text, annotations, and layout follow the requirements of a report, thesis, presentation, or journal figure.
| Customization area | Available controls |
|---|---|
| Aspect ratio | Five presets: 4:2.85, 16:9.15, 2:1.05, 3:1.2, and 4:1.35 |
| Axis ranges | Custom minimum and maximum values for supported axes |
| Axis ticks | Adjustable tick count, minor ticks, manually defined custom ticks, and tick-label styling |
| Axis transformations | Logarithmic scales and one or more defined axis-break ranges where supported |
| Number formatting | Normal numerical display, abbreviated/SI-style display, and scientific notation |
| Multiple Y scales | Separate Y scales with adjustable spacing for supported Multi-Y graph types |
| Series appearance | Color, opacity, line width, symbol size, and individual series selection |
| Line styles | Solid, dashed, dotted, dash-dot, area fill, or no line |
| Data symbols | Circle, triangle, square, diamond, star, cross, or no symbol |
| Error and distribution controls | Y-error bars and adjustable histogram bin count where supported |
| Typography | Font family, font size, color, bold, italic, superscript, and subscript |
| Editable labels | Graph text, axis titles, tick labels, series names, and legends |
| Annotations | Horizontal or vertical text, solid or dashed lines, arrows, rectangles, ellipses, and filled shapes |
| Graph interaction | Region zoom, zoom out, element selection, removal, and undo |
| Project continuity | Save and reopen complete .instanano projects containing data and graph settings |
| Graph export | Custom-DPI PNG download with an optional transparent background |
Access note: Graph plotting and general data-processing tools are free. Signing in is required when saving a project or downloading the final PNG graph. Complete XRD and FTIR analysis uses the shared analysis credit plans.
Online XRD Phase Identification, Rietveld Refinement, and RIR Analysis
The integrated XRD matching tool compares experimental diffraction peaks and relative intensities with 2.3+ million searchable reference patterns. Researchers can import an XRD file, use automatic strong-peak detection, correct the selected peaks manually, apply composition filters, and review ranked candidate phases from the same graphing workspace.
Compatible matched references can then be used for browser-based full-pattern refinement and phase quantification. The available structural models and reference-intensity-ratio data determine whether the tool recommends Full Rietveld QPA, Hybrid Rietveld–RIR, RIR QPA, RIR + Profile Fit, or a semi-quantitative profile fit.
XRD Reference Database Coverage
The current production index contains 2,333,617 searchable XRD reference patterns for candidate phase identification. Of these, 2,255,747 references support at least one refinement method in the integrated XRD workflow.
Coverage note: Counts are per searchable reference, not a guarantee that every selected phase combination supports every method. RIR availability is limited to references with a valid value at a Cu, Co, or Mo wavelength supported by the tool.
- Automatic detection of strong experimental XRD peaks.
- Manual addition or removal of peaks directly from the graph.
- Peak-position and relative-intensity comparison.
- 2.3+ million searchable reference patterns.
- Periodic-table element selection.
- AND, OR, and ONLY composition-filter logic.
- Element-count filtering from one to five elements.
- Cu Kα, Co Kα, and Mo Kα wavelength options.
- Ranked candidate phases with match scores.
- Reference-peak overlays on the experimental pattern.
- Automatic recommendation of a compatible Rietveld or RIR method.
- Observed, calculated, difference, background, and reflection displays.
- Phase composition, refined unit cells, calculated HKL reflections, and fit statistics.
- Structured refinement results with a downloadable PDF report.
Free XRD Preview and Complete Matching Result
| XRD capability | Free preview | Complete result |
|---|---|---|
| Experimental peak selection | Automatic or manual | Automatic or manual |
| Reference database search | 2.3+ million searchable reference patterns | 2.3+ million searchable reference patterns |
| Composition and wavelength filters | Included | Included |
| Ranked candidate references | Up to 3 candidates | Up to 30 candidates |
| Reference peaks | Up to 3 peaks per candidate | Complete available reference peaks |
| Reference-pattern overlay | Limited preview overlay | Multiple selectable reference overlays |
| Diffraction information | Limited preview | 2θ, d-spacing, intensity, and available HKL indexing |
| Compound information | Candidate identification preview | Chemical formula and available compound, common, and mineral names |
| Crystal information | Not included in the limited preview | Available crystal system, space group, lattice parameters, cell angles, and molecular weight |
| Filter refinement after unlock | New searches remain available | Refine filters for the same unlocked data and selected peaks for up to 30 days, subject to plan validity |
Scientific note: XRD search-match results provide ranked candidate phases for rapid screening. Rietveld or RIR analysis evaluates a selected model against more of the experimental pattern, but a good fit does not independently establish phase identity. Interpret the result with the sample chemistry, measurement conditions, residual features, and supporting characterization evidence.
Start with the free preview. Upload an XRD pattern, review the leading candidates, and access the complete result only when additional reference peaks, HKL indexing, and crystal information are required.
Start XRD Phase SearchOnline FTIR Matching, Functional Groups, and Composition Analysis
Use FTIR Analysis to compare an absorbance or transmittance spectrum with reference spectral patterns. Select Match FTIR Spectrum for a free preview of the leading InstaNANO IDs and similarities. Full matching uses one analysis credit per sample and provides reference names, spectrum overlays, available metadata, and name or CAS filters.
- Reference comparison: inspect ranked candidates and retain useful overlays with Add to graph.
- Functional groups: use Estimate Functional Groups to review suggested assignments at detected or manually selected peaks.
- Composition and impurities: fit selected references with Estimate Composition & Impurities and review their spectral contributions and residual mismatch.
- Spectrum conversion: convert recognizable transmittance and absorbance data while retaining the original signal column.
Composition estimates describe spectral contributions rather than calibrated mass fractions. Review unexplained bands and residual mismatch with the sample chemistry when investigating possible impurities.
Free Spectroscopy Peak-Reference Lookup
The Other Match panel provides free reference suggestions for a selected experimental peak. Select a peak from the plotted spectrum and compare it with nearby reference positions for the supported technique.
- XPS: group, material, and reference-note suggestions.
- Raman: material, vibrational-mode, and reference-note suggestions.
- UV–Vis: nearby λmax, material, characteristic, and description.
- 1H NMR: chemical-shift type, assignment, and description.
- 13C NMR: chemical-shift type, assignment, and description.
This feature is a selected-peak reference lookup rather than complete full-spectrum identification. It is useful for quickly examining possible assignments while reviewing the experimental graph.
How to Create a Scientific Graph
- Import or enter the experimental data.
Drag and drop a supported file, select a file from the computer, paste spreadsheet data, or enter values directly into the editable table.
- Select the required graph type.
Choose a line, bar, area, scatter, scatter-line, histogram, stacked, Multi-Y, error-bar, or ternary graph according to the dataset.
- Apply an instrument preset when relevant.
Select XRD, FTIR, Raman, XPS, UV–Vis, NMR, TGA, DSC, BET, SAXS, PL, Tauc, or tensile testing to apply the corresponding scientific axis convention.
- Process and analyze the data.
Apply smoothing, baseline correction, area or FWHM calculation, curve fitting, multi-peak fitting, or a Tauc transformation as required by the analysis.
- Format the graph for scientific communication.
Adjust the axes, aspect ratio, line and symbol styles, fonts, legends, annotations, shapes, number format, and graph scale.
- Save or download the result.
Sign in to save an editable InstaNANO project or download a custom-DPI PNG with an optional transparent background.
- Continue to data matching when needed.
Run XRD phase identification or FTIR spectrum matching from the experimental graph. The separate Other Match panel provides free selected-peak reference lookup for XPS, Raman, UV–Vis, and NMR.
Designed for Research and Laboratory Workflows
- PhD researchers and postdoctoral scientists preparing experimental figures.
- Students learning scientific graphing and data interpretation.
- University laboratories processing repeated characterization datasets.
- Materials-science and nanotechnology researchers comparing instrument results.
- R&D teams requiring rapid visualization of experimental data.
- Authors preparing journal-friendly figures, theses, reports, and presentations.
- XRD users screening possible crystalline phases before detailed refinement.
- Spectroscopy users reviewing possible assignments for selected peaks.
Frequently Asked Questions
Is the InstaNANO Graph Plotter free?
Yes. Graph plotting, customization, and general processing tools are free. Signing in is required to save projects and download PNG graphs. XRD and FTIR matching include free previews; complete matching and advanced analysis use credits.
Do I need to install graphing software?
No. InstaNANO runs in a desktop web browser and does not require software installation. It can be used through supported desktop browsers on Windows, macOS, and Linux.
Which scientific file formats can I upload?
The tool supports CSV, TXT, XLS, XLSX, XRDML, XY, XYE, ASC, DAT, UXD, supported RAW diffraction files, compatible FTIR SPA and ISPD files, supported Bruker NMR datasets, and saved InstaNANO project files.
Can I plot more than one dataset?
Yes. Multiple Y-series can be imported, enabled, disabled, renamed, recolored, and displayed using standard, stacked, error-bar, or supported Multi-Y graph layouts.
Can I prepare journal-friendly scientific figures?
Yes. The tool includes adjustable aspect ratios, custom axis limits and ticks, logarithmic scales, axis breaks, line and symbol controls, editable text and legends, annotations, custom DPI, and transparent-background PNG export. The final formatting should be checked against the requirements of the intended journal.
Does the tool perform baseline correction and peak fitting?
Yes. It includes arPLS baseline correction, local-polynomial smoothing, area and FWHM calculations, linear and quadratic fitting, and multi-peak fitting with six supported peak-profile families.
How large is the XRD reference collection?
The XRD phase-identification workflow searches 2,333,617 reference patterns using experimental peak positions, relative intensities, wavelength settings, and optional composition filters.
What is included in the free XRD preview?
The free preview provides up to three ranked candidate references and up to three reference peaks per candidate, together with a limited graph overlay for initial screening.
What is included after unlocking the complete XRD result?
The complete result provides up to 30 ranked candidates, complete available reference peaks, 2θ, d-spacing, intensity, available HKL indexing, names, formulas, and available crystal-structure information.
How are XRD matching credits counted?
One credit is required for each enabled experimental sample or Y-series included in the XRD search. A changed experimental dataset is treated as a new sample search.
Can I change XRD filters after unlocking a result?
Yes. Save the InstaNANO project to preserve the unlocked data, selected peaks, filters, and reference selections. Filters for the same unlocked data and peak selection can be refined for up to 30 days, subject to the applicable account and plan validity.
Does an XRD match prove that a phase is present?
No single database match independently proves phase presence. The ranked candidates should be evaluated using the complete experimental pattern, known composition, measurement conditions, possible mixed phases, and supporting characterization evidence.
Does the online XRD tool perform Rietveld refinement?
Yes. After identifying candidate phases, compatible references can be taken into the integrated Rietveld and RIR refinement tool. It supports full-pattern fitting, several model-dependent quantification methods, calculated reflections, fit statistics, residual diagnostics, and PDF reporting.
How many credits does online XRD refinement use?
Refinement uses one credit after the same XRD sample has already been unlocked. Starting directly from a locked single-sample match uses two credits because the matching and refinement access are unlocked together. Repeating the refinement for the same unchanged sample during its active access period does not use another credit.
Can I match FTIR spectra and estimate functional groups online?
Yes. The FTIR Analysis panel compares the visible measured range of one enabled spectrum with reference spectra. A free preview shows the leading InstaNANO IDs and similarities. One credit activates full matching, reference overlays, name or CAS filtering, functional-group estimation, and reference-based composition analysis for the sample, within its access period and usage allowances. See the FTIR plotter and analysis guide.
How does Other Match differ from FTIR spectrum matching?
Other Match provides free selected-peak reference lookup for XPS, Raman, UV–Vis, 1H NMR, and 13C NMR. FTIR uses its dedicated FTIR Analysis panel for spectrum comparison and advanced interpretation.
InstaNANO Graph Plotter Specifications
| Product | InstaNANO Online Graph Plotter |
|---|---|
| Category | Browser-based scientific graph plotting and data-analysis application |
| Primary access model | Free graph plotting and general processing, free XRD and FTIR match previews, and optional credit-based complete analysis |
| Primary scientific workflows | XRD, FTIR, Raman, XPS, UV–Vis, PL, NMR, TGA, DSC, BET, SAXS, Tauc, and tensile data |
| Output | Custom-DPI PNG graphs and editable InstaNANO project files |
| XRD capability | Automatic or manual peak selection, 2,333,617 searchable reference patterns, ranked phase candidates, and model-dependent Rietveld or RIR full-pattern analysis |
| FTIR capability | Reference spectrum matching, functional-group estimation, semi-quantitative spectral composition, impurity review, and absorbance/transmittance conversion |
| Installation | No installation; designed for desktop web browsers |
Start Plotting Scientific Data
Import the experimental data and begin with the free graphing and processing tools. For XRD data, continue from candidate-phase screening to a compatible Rietveld or RIR workflow when full-pattern analysis is required. For FTIR spectra, compare reference patterns and investigate functional groups and spectral composition.