Fringes Calculations with Reference Material Matching
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Original price was: $100.0.$29.0Current price is: $29.0.
Description
Fringes Calculations with Reference Material Matching
You have synthesized your material and want to confirm whether the features seen in TEM images are your synthesized material or an impurity. If two different materials are present in one sample and you need to determine which structure belongs to which material, we can help. We will analyze your fringes data, calculate d values, and match them with reference materials to determine whether the observed fringes correspond to your material or another phase.
File Upload Guidelines
- Provide high-resolution TEM images or raw microscope files (TIFF, PNG, JPEG, DM3/DM4, SER, MRC) when available.
- Include scale bar or calibration information, imaging parameters (accelerating voltage, camera length), and magnification.
- Mark or describe regions of interest and indicate if multiple phases are suspected.
- Provide any known sample composition, expected phases, or reference patterns to improve matching accuracy.
- If submitting multiple files, compress them into a single ZIP and use clear filenames (sampleID_ROI_description.ext).
What You Will Get
- Calculated d values: Precise d-spacing values derived from your fringes data.
- Reference material match details: Matched phases from reference databases with match confidence and notes on possible impurities or secondary phases.
- Publication-ready fringes image: Edited fringes image suitable for inclusion in international publications, plus a concise analysis summary.
Why Choose InstaNANO
- Specialized expertise in HRTEM fringes analysis and d-spacing calculations.
- Matching against established crystallographic reference data to increase identification confidence.
- Delivery of publication-ready figures and a clear, concise report.
- Confidential handling of your data and support for follow-up questions.
NOTE: For related services see HRTEM Image Processing, Phase Identification & Indexing, and Electron Diffraction Analysis.



